Publications of 2004 
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Conference articles
  1. Yann-Gaël Guéhéneuc. A Reverse Engineering Tool for Precise Class Diagrams. In Janice Singer and Hanan Lutfiyya, editors, Proceedings of the 14th IBM Centers for Advanced Studies Conference (CASCON), pages 28–41, October 2004. ACM Press. Note: 14 pages. [Text] [Slides] Keyword(s): Topic: Binary class relations, Rubrique : relations binaires entre classes, Conference: CASCON.

  2. Yann-Gaël Guéhéneuc. A Systematic Study of UML Class Diagram Constituents for their Abstract and Precise Recovery. In Doo-Hwan Bae and William C. Chu, editors, Proceedings of the 11th Asia-Pacific Software Engineering Conference (APSEC), pages 265–274, November-December 2004. IEEE CS Press. Note: 10 pages. [Text] [Slides] Keyword(s): Topic: Binary class relations, Rubrique : relations binaires entre classes, Conference: APSEC.

  3. Yann-Gaël Guéhéneuc. Abstract and Precise Recovery of UML Class Diagram Constituents. In Mark Harman and Bogdan Korel, editors, Proceedings of the 20th International Conference and Software Maintenance (ICSM), pages 523, September 2004. IEEE CS Press. Note: 1 page. Poster. [Text] Keyword(s): Topic: Binary class relations, Rubrique : relations binaires entre classes, Conference: ICSM, Conference: ICSME.

  4. Yann-Gaël Guéhéneuc and Hervé Albin-Amiot. Recovering Binary Class Relationships: Putting Icing on the UML Cake. In Doug C. Schmidt, editor, Proceedings of the 19th Conference on Object-Oriented Programming, Systems, Languages, and Applications (OOPSLA), pages 301–314, October 2004. ACM Press. Note: 14 pages. [Text] [Slides] Keyword(s): Topic: Binary class relations, Rubrique : relations binaires entre classes, Conference: OOPSLA.

  5. Yann-Gaël Guéhéneuc, Houari Sahraoui, and Farouk Zaidi. Fingerprinting Design Patterns. In Eleni Stroulia and Andrea de Lucia, editors, Proceedings of the 11th Working Conference on Reverse Engineering (WCRE), pages 172–181, November 2004. IEEE CS Press. Note: 10 pages. [Text] [Slides] Keyword(s): Topic: Design patterns, Rubrique : patrons de conception, Conference: WCRE.


Internal reports
  1. Khashayar Khosravi and Yann-Gaël Guéhéneuc. A Quality Model for Design Patterns. Technical report 1249, University of Montreal, September 2004. Note: 94 pages. [Text] Keyword(s): Topic: Quality models, Rubrique : modèles de qualité, Topic: Design patterns, Rubrique : patrons de conception.


Miscellaneous
  1. Yann-Gaël Guéhéneuc. PMARt, since November 2004. Note: A database of occurrences of patterns in object-oriented programs. [Text] Keyword(s): Topic: Design patterns, Rubrique : patrons de conception.