- Weitao Pan, Hironori Washizaki, Nobukazu Yoshioka, Yoshiaki Fukazawa, Foutse Khomh, and Yann-Gaël Guéhéneuc. A Machine Learning Based Approach to Detect Machine Learning Design Patterns. In Joo-yong Yi and Gary T. Leavens, editors, Proceedings of the 30th Asia-Pacific Software Engineering Conference (APSEC), pages 574–578, December 2023. IEEE CS Press. Note: 5 pages. Early Research Achievements Track. [Text] [Slides] Keyword(s): Topic: Design patterns, Conference: APSEC.
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